Dr. Schenk ParticleInspect for glass is designed for highspeed particle detection of bare glass and coated glass with layer films like ITO, GIN, Cu, A-Si and Mo. It is avialable as a stand-alone version for offline laboratory applications and as an integrated inline production system.
Dr. Schenk ParticleInspect provides high-resolution scanning for smallest particles, such as:
This ensures that sources of contamination on glass sheets can be identified and addressed quickly before large production losses occur.
ParticleInspect can differentiate clearly between A-side and B-side particles, an exclusive benefit of the Dr. Schenk inspection. The modular system design enables delivery of complete AOI solutions either as stand-alone components or as customized modules for easy integration into existing production lines.