Dr. Schenk GmbH

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Dr. Schenk 2 Steps Ahead with Brand New I-V Curve Tracer

Currently, Dr. Schenk GmbH is the only “total-solution provider“
of metrology systems for PV thin-film modules worldwide. Having installed more than fifty systems into running thin-film production lines within the past 3 years, Dr. Schenk‘s specialized solutions for virtually every processing step along the line are unmatched in the industry. Now, Dr. Schenk GmbH has taken the next step in thin-film metrology.

”Indirect metrology tests”, for example the measurement of pinhole density, layer thickness or haze monitoring, enable the manufacturer to evaluate the module quality and give an early warning as soon as a process step no longer meets the preset tolerances. These indirect measurements alone cannot make a prediction about the final electrical efficiency of the solar panel. As today‘s sun simulators or flashers are installed only at the very end of the production line when low quality modules have already gone through expensive back-end processing, Dr. Schenk has developed a unique innovation that is complimentary to flashers but enables an early feedback on the module efficiency!

Dr. Schenk‘s brand new I-V Curve Tracer meets three challenges that flashers cannot overcome and is therefore the perfect addition to every thin-film line.

  • As flashers are installed at the end of the production line, a module with bad/low efficiency can only be sorted out after complete processing. This results in a waste of expensive process capacity and material, e.g. for laminating or cover glass processing. In order to avoid this loss, Dr. Schenk‘s I-V Curve Tracer is integrated before the lamination step and enables the manufacturer to sort out faulty products before the module is sent on to cost intensive back-end steps.
  • Whereas a flasher test can only deliver one efficiency result for the entire panel, the I-V Curve Tracer measures space-, wavelength-and irradiance-resolved and can, thus, identify the exact position or cell of an irregularity.
  • By matching these detailed efficiency results with data from the indirect measurements of the SolarInspect and SolarMeasure systems along the production line, manufacturers can make immediate and long-term correlations between local defects and panel efficiency. These correlations enable manufacturers to define and optimize process criteria as well as quality rules for each production step. Corrective actions can be taken as early as possible and production costs can be reduced.

With the I-V Curve Tracer, a brand new measurement innovation, Dr. Schenk sets itself 2 steps ahead of the metrology competition. With this unique and innovative product, customers can evaluate and correlate metrology data from optical and electrical measurements along the line and perceive an early feedback and a comprehensive overview of the entire manufacturing process. This global evaluation, uniquely offered by Dr. Schenk GmbH, reveals the real potential for process optimization.

For further information on the I-V Curve Tracer and other solutions for the thin-film PV industry, please refer to the I-V Curve Tracer product page.

To download the Product Newsletter on the I-V Curve Tracer as PDF, please click here

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